Ujjwal Guin is currently an Associate Professor at the Department of Electrical and Computer Engineering at Auburn University. He received Bryghte D. and Patricia M. Godbold Associate Professorship for the highest research, teaching, and service achievements at Auburn University. He received his Ph.D. degree from the University of Connecticut in 2016. He is actively involved in projects in the fields of Hardware Security and Trust, Supply Chain Security, Cybersecurity, and VLSI Design and Test. He has developed several on-chip structures and techniques to improve the security, trustworthiness, and reliability of integrated circuits. He co-authored the book "Counterfeit Integrated Circuits: Detection and Avoidance''. He also authored two book chapters, over thirty journal articles, and forty refereed conference papers. His work has been recognized through several best paper nominations, awards, research grants, and prizes from various security competitions. One of his papers has been referenced in the "White House 100-Day Reviews under EO 14017" report, specifically in the context of "Building Resilient Supply Chains," dated June 2021. His projects are sponsored by the United States Army, Air Force Office of Scientific Research (AFOSR), Secret Service, National Science Foundation (NSF), and Air Force Research Laboratory (AFRL). He currently serves or has served several technical program committees in several reputed conferences, such as DAC, HOST, VTS, PAINE, VLSID, GLSVLSI, ISVLSI, and Blockchain. He is the Program Co-Chair of HOST 2025 and ATS 2024. He is a senior member of IEEE and a member of ACM.

Dr. Guin's current research focuses on:

• Detection and Avoidance of Counterfeit ICs
• Prevention of the Piracy of Intellectual Properties (IP)
• VLSI Testing: Traditional and Emerging Technologies
• Blockchain for Supply Chain Security and Implementation of Zero-Knowledge Proofs
• Trusted Electronic Systems
• Secure Heterogeneous Integration