Professional Activities and Service

◾ Editorial Activities

• Associate Editor, Journal of Electronic Testing: Theory and Applications (JETTA), 2022-Present
• Associate Editor, Journal of Hardware and Systems Security (HaSS), 2022-Present
• Guest Editor, IEEE Blockchain Technical Briefs, 2022
• Guest Editor, IEEE Design & Test - SI:ITC2018.

◾ Conference Organizing Committee

• Program Co-Chair, IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2025
• Program Co-Chair, Asian Test Symposium, 2025
• Special Session Chair, VLSI Test Symposium (VTS), 2025
• Co-Publication Chair, IEEE Physical Assurance and Inspection of Electronics (PAINE), 2024
• Vice-program Co-Chair, IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2024
• Student Activities Chair, VLSI Test Symposium (VTS), 2021-2024
• Track Co-Chair, Test, Verification, and Security (TVS), ICCD, 2024
• Track Co-Chair, Hardware and System Security (HSS), ISQED, 2024
• Program Co-Chair, IEEE Physical Assurance and Inspection of Electronics (PAINE), 2023
• Special Session Chair, GLSVLSI, 2023
• Finance Chair, IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2023
• Chair, HOST 2022 Microelectronics Security Challenge, 2022
• Registration Chair/Vice Finance, IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2021-2022
• Vice Program Chair, CAD4 Security Workshop, DAC, 2022
• Vice Program Chair, IEEE Physical Assurance and Inspection of Electronics (PAINE), 2022
• Technical Program Co-Chair, IEEE International Test Conference - India, 2022
• Publication Chair, IEEE International Conference on Omni-Layer Intelligent Systems (COINS), 2021
• Registration Chair, IEEE Physical Assurance and Inspection of Electronics (PAINE), 2020
• Audio/Video Chair, VLSI Test Symposium (VTS), 2019-2020

◾ Session Organizer

• Harmonizing Hardware Security with Emerging Technologies, IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2024
• Detection and Avoidance of Counterfeit ICs, IEEE International Test Conference - India, 2022
• Security-Aware Computer Aided Electronic Design, Design Automation Conference (DAC), 2021
• Reliability Analysis for AI/ML Hardware, IEEE VLSI Test Symposium (VTS), 2021
• Novel Attacks on Logic Locking, IEEE VLSI Test Symposium (VTS), 2020
• The Recent Advance in Hardware Implementation of Post-Quantum Cryptography, IEEE VLSI Test Symposium (VTS), 2020
• Special Session on Hardware Security, Asian Test Symposium (ATS), 2019
• Reverse Engineering Track Co-Chair, International Symposium for Testing and Failure Analysis (ISTFA), 2018

◾ Technical Program Committee

• IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2020-Present
• International Test Conference (ITC), 2022-Present
• IEEE Physical Assurance and Inspection of Electronics (PAINE), 2020-Present
• VLSI Test Symposium (VTS), 2019-Present
• International Conference on VLSI Design (VLSID), 2019-Present
• IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2019-Present
• IEEE International Conference on Blockchain, 2019-Present
• ACM Great Lakes Symposium on VLSI (GLSVLSI), 2019-Present
• Design Automation Conference (DAC), 2020-2022
• International Workshop on Cyberspace Security and Artificial Intelligence, 2021
• IEEE International Conference on Omni-Layer Intelligent Systems (COINS), 2021
• International Symposium on Consumer Technologies (ISCT), 2019
• IEEE International Conference on Computer Design (ICCD), 2018
• IEEE Cyber Science and Technology Congress (CyberSciTech), 2018
• International Symposium on Devices, Circuits and Systems (ISDCS), 2018
• IEEE North Atlantic Test Workshop (NATW), 2018.

◾ Groups

• Liaison of SAE G-19A Test Laboratory Standards Development Committee for developing aerospace standard AS6171, 2015-Present
• G-32 Cyber Physical Systems Security Committee, 2019-Present
• Subgroup lead of AS6171/1: Suspect/Counterfeit Test Evaluation Method, 2016-2022

◾ Tutorials

• Effective Low-Cost Strategies for Detecting Recycled Integrated Circuits, IEEE International Test Conference - India, 2024
• Logic Locking: Current Trends, Attacks and Future Directions, International Conference on VLSI Design (VLSID), 2019

◾ Invited Talks

• Tessent Thursday Seminar, 2024, Title: Automatic Test Pattern Generation using SAT Attack.
• Microelectronics Reliability and Qualification Workshop (MRQW), The Aerospace Corporation, El Segundo, CA, 2024, Title: Self-referencing Approaches Using Memory Power-up States for Detecting Recycled ICs.
• Trust and Assurance Workshop, Electronics Division Meeting & Trust & Assurance Subcommittee Meeting, Arlington, VA, 2022, Title: Counterfeit Defect Coverage That Was Completed By The SAE G-19A Group.
• Micro-Electronics Security Training (MEST) Center, Gainesville, FL, 2021, Title: Towards Resilient Approaches for Detecting Recycled ICs.
• SRA Symposium on Hardware and Cyber-Physical Systems, Arlington, VA, Dec. 2019, Title: Counterfeit Defect Coverage Analysis: Current Status and Future Directions.
• IEEE Electronic Design Process Symposium (EDPS), Milpitas, CA, Sept. 2018, Title: Cybersecurity Solutions in Hardware.
• IEEE Microprocessor Test and Verification (MTV) Conference, Austin, TX, Dec. 2017, Title:Mutual Authentication: A Robust Solution for Preventing System-Level Cloning.
• International Test Conference (ITC), Fort Worth, TX, Nov. 2017, Title: Efficient Strategies for Combating Die and IC Recycling.
• IEEE North Atlantic Test Workshop (NATW), Warwick, RI, Title: Efficient Strategies for Detection and Avoidance of Counterfeit ICs.

◾ Panels

• Panel Chair, Blockchain for supply chain, Safeguarding Critical System Supply Chains Against Compromise (Networks, Processes, Parts, Materials, Software, and Information), NSF Sponsored Workshop, CALCE, 2022

◾ Session Chairs

• Design Automation Conference (DAC), 2017-2022
• IEEE VLSI Test Symposium (VTS), 2017-Present
• GLSVLSI, 2022-Present
• International Test Conference (ITC), 2017-2021
• IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2019
• International Symposium for Testing and Failure Analysis (ISTFA), 2018
• International Conference On Computer Aided Design (ICCAD), 2017-2018
• IEEE International Conference on Blockchain, 2018
• IEEE International Conference on Computer Design (ICCD), 2018

◾ Reviewer for

• IEEE Transactions on VLSI Systems (TVLSI), 2015-Present
• IEEE Transactions on Information Forensics & Security (TIFS), 2018-Present
• Transactions on Computers (TC), 2017-Present
• Journal of Electronic Testing: Theory and Applications (JETTA), 2012-Present
• IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2016-Present
• ACM Transactions on Design Automation of Electronic Systems (TODAES), 2014-Present
• Journal of Hardware and Systems Security (HASS), 2016-Present
• IEEE Internet of Things Journal, 2019-Present
• Journal on Emerging Technologies in Computing Systems (JETC), 2017-Present
• IEEE Design & Test, 2014-2018
• Computers in Industry, 2020
• MDPI Cryptography, 2018
• Integration, the VLSI Journal, 2018
• Transactions on Multi-Scale Computing Systems, 2018
• Future Generation Computer Systems, 2018
• IEEE Transactions on Industrial Informatics (TII), 2018
• Embedded Systems Letters, 2017
• IEEE Transactions on Circuits and Systems (TCAS), 2017
• IEEE Transactions on Dependable and Secure Computing (TDSC), 2016, 2017
• IEEE Computer (COMSI), 2016
• IEEE Transactions on Multi-Scale Computing Systems (TMSCS), 2015
• IET Computers & Digital Techniques, 2014

◾ Judge for Poster Sessions and Hardware Demos

• IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2017-2020;
• Graduate Engineering Research Showcase, Auburn University, 2016-2020.
• Hack@DAC at Design Automation Conference (DAC), 2017;

◾ Conference Presentations

• Design Automation Conference (DAC), 2022
• GLSVLSI, 2022
• IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2018,2019
• IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2019
• IEEE VLSI Test Symposium (VTS), 2017, 2018;
• International Conference on VLSI Design (VLSID), 2018, 2019;
• IEEE International Conference on Blockchain, 2018
• IEEE North Atlantic Test Workshop (NATW), 2017.