Awards & Honors

• Best Paper, "Beware of Discarding Used SRAMs: Information is Stored Permanently," IEEE Physical Assurance and Inspection of Electronics (PAINE), 2022.

• Best Paper Nomination, "Defect Characterization and Testing of Skyrmion-Based Logic Circuits," VLSI Test Symposium (VTS), 2021.

• NSF CISE Research Initiation Initiative (CRII), 2018.

• Most Downloaded Article, U. Guin, D. DiMase, and M. Tehranipoor, "Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead," Journal of Electronic Testing: Theory and Applications (JETTA), 2014.

• Best Poster Nomination, "Low-cost On-Chip Structures for Combating Die andIC Recycling", PhD Forum at DAC, 2014.

• Best Student Paper Award, U. Guin and M. Tehranipoor, "On Selection of Counterfeit IC Detection Methods," IEEE North Atlantic Test Workshop (NATW), 2013.

Student Awards Under My Supervision

• Finalist, Bring Down Counterfeiting Policy Hackathon, October 2022.

• 1st Place, HeLLO: CTF '21, Attacks on Hardware Logic Locking & Obfuscation Capture The Flag 2021, January 2022.

• 1st Place, Hack@CHES 2021, The Hardware Capture the Flag in Conjunction with International Conference on Cryptographic Hardware and Embedded Systems (CHES), September 2021.

• 2nd Place, Hack@SEC 2021, The Hardware Capture the Flag in Conjunction with USENIX Security Symposium, August 2021.

• 1st Place, UF/FICS Hardware De-obfuscation Competition, December 2019.