Vishwani D. Agrawal

Professor Emeritus, Electrical and Computer Engineering



Department of Electrical and Computer Engineering
Samuel Ginn College of Engineering
Auburn University

Editor-in-Chief, Journal of Electronic Testing: Theory and Applications (JETTA)


For JETTA Editors, Volume 39, 2023, No. 1, 2, 3, 4, 5-6

COURSES (with links to previous offerings):
Spring 2016: ELEC5200-001/6200-001 Computer Architecture and Design, Broun 235, MWF 11AM.
Spring 2016: ELEC7770-001 Advanced VLSI Design, Broun 235, MWF 3PM.
Spring 2016: ELEC7950-001 VLSI Design & Test Seminar, Broun 235, W 4PM.
Fall 2015: ELEC2200-002 Digital Logic Circuits
Spring 2015: ELEC5270-001/ELEC6270-001 Low-Power Design of Electronic Circuits
Fall 2013: EEV834 Special Module in VLSI Testing, IIT, Delhi, Aug 17-28, 2013
Fall 2013: CSV881 Special Module in Hardware Systems (Low Power Design), IIT, Delhi, Oct 21-31, 2013
Fall 2010: ELEC5770-001/6770-001 VLSI Design (Guest Lecture on Low Power VLSI Design), Nov. 16, 2010
Summer 2010: TSS@ETS'10 Fault Models, Fault Simulation and Test Generation, by Agrawal, Prague, May 22, 2010, Lectures 1, 2, 3, 4, 5
Spring 2010: ELEC7250-001, VLSI Testing (Guest Lectures on RF Testing), March 11, 2010 and April 28, 2009
Spring 2009: ELEC7250-001, VLSI Testing, ATE Classroom Exercise
Summer 2008: RFIC Design and Test Course at TI, Bangalore, India
Summer 2007: Low-Power Design and Test, Hyderabad, July 30-31, 2007
Spring 2006: ELEC7250-001 VLSI Testing
Fall 2004: ELEC7900, Independent Study of Computer Architectures, P. Sinha's Reports: Energy, Crossbar

RESEARCH:
NSF Test Infrastructure Project Overview Presentation, Jan 22, 2009.
Paper: Review of Carbon Nanotube Field Effect Transistors (58 pages), by Alokik Kanwal
Text-Book on Testing, Solution Manual (NOW AVAILABLE), Corrections, etc.
Talks and Papers
Doctoral, Master's and Honors Theses Supervised
Conference and Journal Announcements of General Interest

RESUME: Detailed (39 page pdf) / Two-page doc / 500-word text or pdf or doc / IEEE Style (doc)

EDUCATION:
PhD, EE, 1971, University of Illinois at Urbana-Champaign, Urbana, Illinois, USA
ME, ECE, With Distinction, 1966, Indian Institute of Science, Bangalore, India
BE (Honours), Telecom. Eng., 1964, Indian Institute of Technology Roorkee (the oldest and one of the newest IIT), Roorkee, India

RESEARCH & PUBLICATIONS:
Recent talks and research papers
Books (5): Essentials of Electronic Testing . . . and others
Papers (400+) LATEX .bib file or pdf
Patents (13)

AWARDS (See pages 3 through 5 of Resume for a full List):
2019: Distinguished Alumnus Award, Indian Instutute of Technology, Roorkee
2016: Jake Karrfalt Best Student Paper Award, IEEE-NATW16 for Failures Guide Probabilistic Search for Hard-to-Find Test, by Venkatasubramanian and Agrawal
2014: James Monzel Award for Dedicated Service to IEEE North Atlantic Test Workshop
2013: Marcia Peterman ECE Award from University of Illinois at Urbana-Champaign
2012: TTTC Lifetime Contribution Medal from Test Technology Technical Council of IEEE Computer Society
2006: Life-Time Achievement Award, International Conference on VLSI Design and VLSI Society of India
1998: Harry H. Goode Memorial Award, IEEE Computer Society
1996: Golden Core Charter Member, IEEE Computer Society
1993: Distinguished Alumnus Award, University of Illinois at Urbana-Champaign

PROFESSIONAL:
Professor Emeritus (2016 - ), ECE Department, Auburn University
James J. Danaher Professor (2003-2016), ECE Department, Auburn University
R. R. Malhotra Visiting Chair Professor (2013-2014 Sabbatical), Department of Computer Science and Engineering, IIT-Delhi
Member, Distinguished Member of Technical Staff (1978-2002), Bell Labs and Agere Systems
Visiting Professor (1990-2003), Rutgers University, VLSI Testing Course, Spring 2002
Founder and Editor-in-Chief (1990-), JETTA-general, instructions for authors, cfp, etc., paper submission
Associate Editor (2003-08), IEEE Transactions on VLSI Systems
Board of Governors (1987-89), IEEE Computer Society
Editor-in-Chief (1985-87), IEEE Design & Test of Computers
Founder and Consulting Editor, Frontiers in Electronic Testing Book Series
Chairman, Steering Committee, VDAT Symposium and VLSI Design Conference
Board of Directors (1999-2005), Advisory Board (2005-), ECE Alumni Assoc., Univ. of Illinois at Urbana-Champaign
Member (2003-), EE Advisory Board, The City College of New York
Member (1997-2001), ECE Industrial Advisory Board, New Jersey Institute of Technology
Professional Societies: Fellow IETE, India (1983); Life Fellow IEEE (1986); Lifetime Fellow ACM (2002)

PERSONAL: Photo Album Prathima

ADDRESS: Vishwani D. Agrawal
Home:
774 Millers Point Road
Auburn, AL 36830, USA
(908) 938-1219 (mobile)
Office:
Auburn University
Dept. of ECE, 200 Broun Hall
Auburn, AL 36849-5201, USA
agrawvd@auburn.edu
(908) 938-1219 (mobile), (334) 844-1809 (fax)

PAST AFFILIATIONS:
Rutgers University

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Last modified: Wed Oct 16, 2013, 10:38:30 EDT.