SUMMER 2012 IIT-D M.Tech. Course: VLSI Testing
(EEV834, Special Module in VLSI Testing)
July 24 - August 3, 2012, 3:00-5:00PM, Bharati Building, Room 501
Course Syllabus

Instructor: Vishwani D. Agrawal, James J. Danaher Professor of ECE, Auburn University

Grade sheet posted on Sep 4, 2012.

EXAM: Take-home problems, assigned August 1, 2012, due in class August 3, 2012, by 5:00PM.

HOMEWORK:
Homework 1, assigned July 24, due July 26.
Homework 2, assigned July 30, due Aug 1.

LECTURES (17):
Lecture 1: Introduction, July 24, 2012
Lecture 2: Yield and Quality, July 24, 2012
Lecture 3: Fault Modeling, July 25, 2012
Lecture 4: Testability Analysis, July 25, 2012
Lecture 5: Logic Simulation, July 26, 2012
Lecture 6: Fault Simulation, July 26, 2012
Lecture 7: Combinational ATPG, July 27, 2012
Lecture 8: Squential ATPG, July 27, 2012
Lecture 9: Delay Test, July 28, 2012
Lecture 10: Memory Test, July 28, 2012
Lecture11: Analog Test, July 30, 2012
Lecture 12: Model-Based and Alternate Test, July 30, 2012
Lecture 13: DFT and Scan, July 31, 2012
Lecture 14: BIST, July 31, 2012
Lectures 15: System Diagnosis, Aug 1, 2012
Lectures 16: RF Testing - Introduction and Gain Measurement, Aug 1, 2012
Lectures 17: RF Testing - Linearity and Noise Measurements, Aug 3, 2012

PREVIOUS OFFERINGS BY PROF. V. AGRAWAL:
Summer 2011 Low-Power Design of Digital VLSI Circuits, IIT Delhi, July 26 - Aug 6, 2011
Summer 2010 VLSI Testing, IIT Delhi, Aug 7-13, 2010
Summer 2009 VLSI Testing, IIT Delhi, July 30 - Aug 13, 2009