Functional and Parametric IC Testing on the ADVANTEST T2000 Test System

Abstract:

The ADVANTEST T2000 IC/SOC tester is designed around the concept of Open Architecture, allowing the system to be configured for use in a wide variety of test case scenarios.  The T2000 GS system at Auburn University is capable of testing digital integrated circuits (ICs) of up to 128 signal pins, at speeds of up to 250 MHz, with up to 32 programmable power supply values. Both functional and parametric tests can be performed. Functional tests can be created from test patterns from simulation or test patterns produced by ATPG tools, such as Mentor Graphics “Fastscan”. Parametric tests include contact tests, input/output pin DC and AC parametric tests, and IDD tests.  The goals of this presentation are to provide an overview of the T2000 system and the process for creating functional and parametric test programs for a simple digital IC. Attendees will be encouraged to learn and utilize the T2000 system in their research activities related to VLSI design and test.

Bio:

Victor P. Nelson is a Professor and Assistant Chair of Electrical and Computer Engineering at Auburn University, where he has been on the faculty since 1978. His primary research interests include embedded systems, FPGA testing, digital systems design with FPGAs, and computer-aided design and testing of digital systems and application-specific integrated circuits (ASICs). He is co-author of the textbook Digital Logic Circuit Analysis and Design and IEEE tutorial book Fault-Tolerant Computing. He is past chair of the ECE Curriculum Committee and coordinator of the ECE Graduate Program, and served one year as Associate Dean for Assessment in the College of Engineering. He was a co-winner of the 2005 “Wireless Educator of the Year” award from the Global Wireless Education Consortium for his role as one of the developers of the Bachelor of Wireless Engineering program at Auburn University, which is the first of its kind in the U.S., and served as the director of that program until 2017. He received the Birdsong Merit Teaching Award in 2000 and the Walker Merit Teaching Award in 2002 from the College of Engineering, and was named outstanding member of the Graduate Faculty in 2004.

He is a member of the IEEE Education Society, receiving its Distinguished Member Award in 2013 and the Edwin C. Jones, Jr. Meritorious Service Award in 2015 for his service as a member of the Board of Governors, chair of the Constitution and Bylaws committee, and as an associate editor of the IEEE Transactions on Education. He was a member of the IEEE Computer Society/ACM Task Forces that developed the Computer Engineering 2004 (CE20014) and Computer Engineering 2016 (CE2016) reports on model computer engineering curricula.  He is active in accreditation activities, serving as an ABET program evaluator since 2001, as a commissioner of the ABET Engineering Accreditation Commission, and as a member and mentor coordinator of the IEEE Committee on Engineering Accreditation Activities (CEAA).  He is also a member of ASEE, and previously served as chair of the ASEE ECE Division.

Presentation Slides

Last Updated: Nov 10, 2021