Books by Vishwani D. Agrawal

Text-Book:

M. L. Bushnell and V. D. Agrawal, Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, Boston: Springer, 2005, ISBN 0-7923-7991-8; this printing includes corrections over the 2000, 2001 and 2004 printings by Kluwer Academic Publishers.
Cover (jpg) / Table of Contents (postscript or pdf) / Preface (postscript or pdf)
Bibliography (postscript or pdf) / Index (postscript or pdf)
COMPLETE LIST of corrections, Some corrected pages for copies prior to 2005 Springer print
LECTURE SLIDES and course material based on this book
SOLUTION MANUAL (for teachers only), for access please send email to: vagrawal@eng.auburn.edu
How to order the book

Other Books by Agrawal:

E. G. Ulrich, V. D. Agrawal and J. H. Arabian, Concurrent and Comparative Discrete Event Simulation, Boston: Kluwer Academic Publishers, 1994, ISBN 0-7923-9411-9.

S. T. Chakradhar, V. D. Agrawal and M. L. Bushnell, Neural Models and Algorithms for Digital Testing, Boston: Kluwer Academic Publishers, 1991, ISBN 0-7923-9165-9.

K.-T. Cheng and V. D. Agrawal, Unified Methods for VLSI Simulation and Test Generation, Boston: Kluwer Academic Publishers, 1989, ISBN 0-7923-9025-3.

V. D. Agrawal and S. C. Seth, Tutorial: Test Generation for VLSI Chips, Los Alamitos, California: IEEE Computer Society Press, 1988, ISBN 0-8186-8786-X.

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