The VLSI Design & Test Seminar Series
seeks to provide an open forum for various faculty, graduate and undergraduate students with research and development efforts in the area of design and test of VLSI systems, including application specific and programmable circuits in digital, analog, and mixed-signal microsystems. The goal is to promote further learning, discussion, and teamwork along with the conception and development of exciting new ideas.

The seminar series counts as a 1-credit course ELEC7950-001 (which may be repeated for up to 3 credits).

This seminar series sponsored by:

the Testing Group at Auburn:

Vishwani Agrawal - Design for Testability (DFT) and low-power design

Foster Dai - mixed-signal and analog design and testing

Vic Nelson - ASIC/FPGA testing and fault tolerance

Adit Singh - digital and mixed-signal VLSI design and Design for Testability (DFT)

Chuck Stroud - digital and mixed-signal Built-In Self-Test (BIST)

Fall 2009 schedule:

When: Wednesdays from 4-5:30PM (* indicates schedule changes)

Where: Broun Hall room 235 (** indicates location change)

Coordinator: Vishwani Agrawal

Invitation: If you are interested in presenting a seminar during Fall 2009, please contact the coordinator.

Notes: The following is a tentative schedule for Fall 2009. The link under Speaker is to an abstract of the presentation and the link under Topic is to a pdf or ppt file of the presentation slides.

Date	Speaker (w/ link to abstract)	Topic (w/ link to presentation slides after seminar date)
Aug. 19	1. Bradley Dutton 2. George J. Starr (ESA'09, July 13-16 talks)	1. Embedded Processor Based Fault Injection and SEU Emulation for FPGAs 2. Application of Embedded Systems in Low Earth Orbit for Measurement of Ionospheric Anomalies
Aug. 26	Priyadharshini Shanmugasundaram	Pattern Compression for Multiple Fault Models
Sep. 2	Mohammed Ali, Neptune Technology	Lithium Hybrid Battery Cell Technology for the Automatic Meter Reading (AMR) and Advanced Metering Interface (AMI) Systems
Sep. 9	Manish Kulkarni	Low Power Implementation of ARM1176JZF-S
Sep. 16	Chuck Stroud	Analog Function Test and Measurement for Self-Healing Mixed Signal Systems
Sep. 23	Mary Pulukuri	On Built-In Self-Test for Multipliers
Sep. 30	1. Bradley Dutton 2. George Starr (Talks for DFT'09, Oct 7-9)	1. Soft Core Embedded Processor Based Built-In Self-Test of FPGAs 2. Automated Generation of BIST and Measurement Circuitry for Mixed-Signal Circuits and Systems
Oct. 7	Vic Nelson	Computer-Aided Design Flows for Digital IC Design
Oct. 14	Adit Singh	A Defect Tolerant and Performance Tunable Gate Architecture for End-of-Roadmap CMOS
Oct. 21	Jie Qin	A CORDIC Based Direct Digital Frequency Synthesis with Partial Dynamic Rotation
Oct. 28	Vishwani Agrawal	Diagnostic Tests and Full-Response Fault Dictionary
Nov. 4	No Seminar	Due to International Test Conference
Nov. 11	Bogdan M. 'Dan' Wilamowski	Problems with Computational Intelligence
Nov. 18	Bruce Kim, University of Alabama	Techniques of Testing Interconnects in High Density Package Substrates
Nov. 25	No Seminar	Due to Thanksgiving break
Dec. 2	Chung-Han J. Chen, Tuskegee University	DFM in VLSI Design

Links to previous semesters of the VLSI Design & Test Seminar Series:

Spring 2009: Coordinator Adit Singh

Fall 2008: Coordinator Chuck Stroud

Spring 2008: Coordinator Vishwani Agrawal

Fall 2007: Coordinator Adit Singh

Spring 2007: Coordinator Chuck Stroud

Fall 2006: Coordinator Adit Singh

Spring 2006: Coordinator Vishwani Agrawal

Fall 2005: Coordinator Chuck Stroud

Spring 2005: Coordinator Adit Singh

Fall 2004: Coordinator Chuck Stroud