Published: Nov 14, 2012 1:00:00 PM
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Vishwani Agrawal, James J. Danaher professor in Auburn University’s Department of Electrical and Computer Engineering, has been awarded the 2012 Computer Society Test Technology Technical Council Lifetime Contribution Medal from the Institute of Electrical and Electronics Engineers (IEEE). The medal is the highest award IEEE presents in the area of test technology.
Agrawal has more than 40 years of industry and higher education experience and has been an Auburn University faculty member since 2003. He is a fellow of IEEE, the Association for Computing Machinery and the Institution of Electronics and Telecommunication Engineers in India. Agrawal also serves as consulting editor of Frontiers in Electronic Testing, associate editor of IEEE Transactions on VLSI Systems and editor-in-chief of Journal of Electronic Testing: Theory and Applications. His research interests include VLSI testing, low-power design of digital logic circuits and computer architecture. Agrawal holds 13 United States patents.