Engineering Showcases New Microscopes for Nanoscience Research

The materials engineering program in the Samuel Ginn College of Engineering recently announced the acquisition of two new state-of-the art microscopes to support and expand Auburn University's research in the nanosciences.

Bryan Chin, professor of materials engineering and director of Auburn's Detection and Food Safety "Peak of Excellence" primary research area, expects the JEOL 700F Field Emission Scanning Electron Microscope and a JEOL 5200 Scanning Probe Microscope with scanning tunneling and atomic force capabilities to meet the scanning electron microscopy and associated analytical and characterization needs of cross-disciplinary nanoscale researchers, both on and off campus, for many years to come. The units will also be used as teaching tools for undergraduate and graduate students.