System-level and circuit-level test approaches for state-of-the-art RF transmitters
Date: Nov. 28, 2007
Time: 4 p.m.
Place: Broun Hall Rm. 235
Sule Ozev
Assistant Professor
Electrical and Computer Engineering at Duke University
Biography
Ozev received a bachelor's degree in electrical engineering from Bogazici University
in Istanbul and her master's and doctoral degrees in computer science and engineering,
both from the University of California, San Diego. Her research interests include
low-cost test approaches for integrated RF wireless circuits, process variability
analysis and test development for analog circuits, diagnosis and yield improvement
for analog/RF circuits, unified chip-level test scheduling approaches for mixed-signal
systems, path delay variability analysis and variability tolerant digital architectures,
and tolerating hard defects in microprocessors through lightweight redundancy.
Abstract
System-level and circuit-level test approaches for state-of-the-art RF transmitters
Ozev's lecture is aimed at providing a comprehensive understanding of system-level
and circuit-level test approaches and analysis of test cost and test quality.
System-level techniques which aim at a quick go/no-go decision and which are geared
towards specific transceiver architectures will be discussed. Circuit-level techniques
that exploit structural information to reduce test cost and increase test quality
will also be covered.
